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Electronic Production Equipment
Nanometrics, Inc. through its wholly owned subsidiaries designs, manufactures, markets, sells and supports thin film, optical critical dimension and overlay dimension metrology and inspection systems used primarily in the manufacturing of semiconductors, solar photovoltaics and high-brightness LEDs, as well as by customers in the silicon wafer and data storage industries. Its automated and integrated systems address numerous process control applications, including critical dimension and film thickness measurement, device topography, defect inspection, overlay registration, and analysis of various other film properties, such as optical, electrical and material characteristics. Nanometrics was founded by Vincent J. Coates in 1975 and is headquartered in Milpitas, CA.
|Timothy J. Stultz||President, Chief Executive Officer & Director|
|Bruce A. Crawford||Chief Operating Officer|
|Ronald W. Kisling||Chief Financial Officer|
|Rollin Kocher||Vice President-Worldwide Sales|
|Nancy E. Egan||General Counsel|